ERDOĞAN, E. 2019. X-ray line-broadening study on sputtered InGaN semiconductor with evaluation of Williamson–Hall and size–strain plot methods. Indian Journal of Physics , vol.93, no.10 , 1313-1318.

ERDOĞAN, E., (2019). X-ray line-broadening study on sputtered InGaN semiconductor with evaluation of Williamson–Hall and size–strain plot methods. Indian Journal of Physics , vol.93, no.10, 1313-1318.

ERDOĞAN, ERMAN. "X-ray line-broadening study on sputtered InGaN semiconductor with evaluation of Williamson–Hall and size–strain plot methods," Indian Journal of Physics , vol.93, no.10, 1313-1318, 2019

ERDOĞAN, ERMAN. "X-ray line-broadening study on sputtered InGaN semiconductor with evaluation of Williamson–Hall and size–strain plot methods." Indian Journal of Physics , vol.93, no.10, pp.1313-1318, 2019

ERDOĞAN, E. (2019) . "X-ray line-broadening study on sputtered InGaN semiconductor with evaluation of Williamson–Hall and size–strain plot methods." Indian Journal of Physics , vol.93, no.10, pp.1313-1318.

@article{article, author={ERMAN ERDOĞAN}, title={X-ray line-broadening study on sputtered InGaN semiconductor with evaluation of Williamson–Hall and size–strain plot methods}, journal={Indian Journal of Physics}, year=2019, pages={1313-1318} }