Orak, I. Et Al. 2017. Electrical and dielectric characterization of Au/ZnO/n-Si device depending frequency and voltage. Chinese Physics B , vol.26, no.2 .

Orak, I., KOÇYİĞİT, A., & Alindal, S., (2017). Electrical and dielectric characterization of Au/ZnO/n-Si device depending frequency and voltage. Chinese Physics B , vol.26, no.2.

Orak, I., ADEM KOÇYİĞİT, And S. Alindal. "Electrical and dielectric characterization of Au/ZnO/n-Si device depending frequency and voltage," Chinese Physics B , vol.26, no.2, 2017

Orak, I. Et Al. "Electrical and dielectric characterization of Au/ZnO/n-Si device depending frequency and voltage." Chinese Physics B , vol.26, no.2, 2017

Orak, I. KOÇYİĞİT, A. And Alindal, S. (2017) . "Electrical and dielectric characterization of Au/ZnO/n-Si device depending frequency and voltage." Chinese Physics B , vol.26, no.2.

@article{article, author={I. Orak Et Al. }, title={Electrical and dielectric characterization of Au/ZnO/n-Si device depending frequency and voltage}, journal={Chinese Physics B}, year=2017}