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Investigation of the Influence of Au (Gold) Doping Concentration on the Structural, Morphological, Optical, and Electrical Parameters of an Al/Au:CuO/n-Si Heterojunction Device
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H. Cavusoglu Et Al. , "Investigation of the Influence of Au (Gold) Doping Concentration on the Structural, Morphological, Optical, and Electrical Parameters of an Al/Au:CuO/n-Si Heterojunction Device," Journal of Electronic Materials , vol.53, no.5, pp.2382-2397, 2024

Cavusoglu, H. Et Al. 2024. Investigation of the Influence of Au (Gold) Doping Concentration on the Structural, Morphological, Optical, and Electrical Parameters of an Al/Au:CuO/n-Si Heterojunction Device. Journal of Electronic Materials , vol.53, no.5 , 2382-2397.

Cavusoglu, H., Hussaini, A. A., Sakalak, H., KOÇYİĞİT, A., Durmaz, F., & Yıldırım, M., (2024). Investigation of the Influence of Au (Gold) Doping Concentration on the Structural, Morphological, Optical, and Electrical Parameters of an Al/Au:CuO/n-Si Heterojunction Device. Journal of Electronic Materials , vol.53, no.5, 2382-2397.

Cavusoglu, Halit Et Al. "Investigation of the Influence of Au (Gold) Doping Concentration on the Structural, Morphological, Optical, and Electrical Parameters of an Al/Au:CuO/n-Si Heterojunction Device," Journal of Electronic Materials , vol.53, no.5, 2382-2397, 2024

Cavusoglu, Halit Et Al. "Investigation of the Influence of Au (Gold) Doping Concentration on the Structural, Morphological, Optical, and Electrical Parameters of an Al/Au:CuO/n-Si Heterojunction Device." Journal of Electronic Materials , vol.53, no.5, pp.2382-2397, 2024

Cavusoglu, H. Et Al. (2024) . "Investigation of the Influence of Au (Gold) Doping Concentration on the Structural, Morphological, Optical, and Electrical Parameters of an Al/Au:CuO/n-Si Heterojunction Device." Journal of Electronic Materials , vol.53, no.5, pp.2382-2397.

@article{article, author={Halit Cavusoglu Et Al. }, title={Investigation of the Influence of Au (Gold) Doping Concentration on the Structural, Morphological, Optical, and Electrical Parameters of an Al/Au:CuO/n-Si Heterojunction Device}, journal={Journal of Electronic Materials}, year=2024, pages={2382-2397} }