Orak, I. And Koçyiğit, A. 2018. The Dielectric Characterization of the SiO2-MWCNT between the metal and semiconductor. International Conference on Innovative Engineering Applications , (Sivas, Turkey), 341-346.

Orak, I., & Koçyiğit, A., (2018). The Dielectric Characterization of the SiO2-MWCNT between the metal and semiconductor . International Conference on Innovative Engineering Applications (pp.341-346). Sivas, Turkey

Orak, Ikram, And ADEM KOÇYİĞİT. "The Dielectric Characterization of the SiO2-MWCNT between the metal and semiconductor," International Conference on Innovative Engineering Applications, Sivas, Turkey, 2018

Orak, Ikram And Koçyiğit, ADEM. "The Dielectric Characterization of the SiO2-MWCNT between the metal and semiconductor." International Conference on Innovative Engineering Applications , Sivas, Turkey, pp.341-346, 2018

Orak, I. And Koçyiğit, A. (2018) . "The Dielectric Characterization of the SiO2-MWCNT between the metal and semiconductor." International Conference on Innovative Engineering Applications , Sivas, Turkey, pp.341-346.

@conferencepaper{conferencepaper, author={Ikram Orak And author={ADEM KOÇYİĞİT}, title={The Dielectric Characterization of the SiO2-MWCNT between the metal and semiconductor}, congress name={International Conference on Innovative Engineering Applications}, city={Sivas}, country={Turkey}, year={2018}, pages={341-346} }