ORAK, İ. And KOÇYİĞİT, A. 2018. The Dielectric Characterization of the SiO2-MWCNT between the metal and semiconductor. International Conference on Innovative Engineering Applications .

ORAK, İ., & KOÇYİĞİT, A., (2018). The Dielectric Characterization of the SiO2-MWCNT between the metal and semiconductor . International Conference on Innovative Engineering Applications

ORAK, İKRAM, And ADEM KOÇYİĞİT. "The Dielectric Characterization of the SiO2-MWCNT between the metal and semiconductor," International Conference on Innovative Engineering Applications, 2018

ORAK, İKRAM And KOÇYİĞİT, ADEM. "The Dielectric Characterization of the SiO2-MWCNT between the metal and semiconductor." International Conference on Innovative Engineering Applications , 2018

ORAK, İ. And KOÇYİĞİT, A. (2018) . "The Dielectric Characterization of the SiO2-MWCNT between the metal and semiconductor." International Conference on Innovative Engineering Applications .

@conferencepaper{conferencepaper, author={İKRAM ORAK And author={ADEM KOÇYİĞİT}, title={The Dielectric Characterization of the SiO2-MWCNT between the metal and semiconductor}, congress name={International Conference on Innovative Engineering Applications}, city={}, country={}, year={2018}}