Koçyiğit, A. And Yildirim, M. 2018. The Dielectric properties of Al/Cu:TiO2/n-Si heterojunction Device. International Congress on Semiconductor Materials and Devices , (Ardahan, Turkey), 24-31.

Koçyiğit, A., & Yildirim, M., (2018). The Dielectric properties of Al/Cu:TiO2/n-Si heterojunction Device . International Congress on Semiconductor Materials and Devices (pp.24-31). Ardahan, Turkey

Koçyiğit, ADEM, And Murat Yildirim. "The Dielectric properties of Al/Cu:TiO2/n-Si heterojunction Device," International Congress on Semiconductor Materials and Devices, Ardahan, Turkey, 2018

Koçyiğit, ADEM And Yildirim, Murat. "The Dielectric properties of Al/Cu:TiO2/n-Si heterojunction Device." International Congress on Semiconductor Materials and Devices , Ardahan, Turkey, pp.24-31, 2018

Koçyiğit, A. And Yildirim, M. (2018) . "The Dielectric properties of Al/Cu:TiO2/n-Si heterojunction Device." International Congress on Semiconductor Materials and Devices , Ardahan, Turkey, pp.24-31.

@conferencepaper{conferencepaper, author={ADEM KOÇYİĞİT And author={Murat Yildirim}, title={The Dielectric properties of Al/Cu:TiO2/n-Si heterojunction Device}, congress name={International Congress on Semiconductor Materials and Devices}, city={Ardahan}, country={Turkey}, year={2018}, pages={24-31} }