The Effect of Pressure on the Microstructural Behavior on SnO2 Thin Films Deposited by RF Sputtering

GÜLER M. O., ALAF M., ALP A., AKBULUT H.

ASME 2. Annual Multifunctional NanocompositesNanomaterials: International ConferenceExhibition, 11 - 13 January 2008, (Full Text) identifier

  • Publication Type: Conference Paper / Full Text
  • Doi Number: 10.1115/mn2008-47071
  • Bilecik Şeyh Edebali University Affiliated: No