Electrical characterization of Cr-doped ZnZrTa2O8 microwave ceramics: Effects of temperature and frequency


ERDOĞAN E., KOÇYİĞİT A., YILMAZ M.

Ceramics International, 2026 (SCI-Expanded, Scopus) identifier

  • Yayın Türü: Makale / Tam Makale
  • Basım Tarihi: 2026
  • Doi Numarası: 10.1016/j.ceramint.2026.03.281
  • Dergi Adı: Ceramics International
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Chemical Abstracts Core, Compendex, INSPEC
  • Anahtar Kelimeler: Cr-doped ZnZrTa2O8, Dielectric characterization, Low-loss ceramics
  • Bilecik Şeyh Edebali Üniversitesi Adresli: Evet

Özet

Low-loss microwave dielectric ceramics gained great deal of interest owing to their applications in the resonators, filters and antennas. In this study, we synthesized Cr-doped ZnZrTa2O8 ceramics by solid-state sintering method for various molecular ratios. The structure, morphology and composition of the Cr-doped ZnZrTa2O8 ceramics were studied by x-ray diffraction (XRD), electron paramagnetic resonance (EPR), scanning electron microscope (SEM) and energy dispersive x-ray spectroscopy (EDS) techniques. The dielectric characterizations were investigated by a dielectric spectrometer for various frequencies and temperatures. While the grain boundaries of the ZnZrTa2O8 ceramics were getting clear and dense by increasing Cr-doping according to SEM, chemical compositions were confirmed by the EDS analysis. The results revealed that the ZnZrTa2O8 ceramics exhibited grains and compositions changed related to doping levels of the Cr. The dielectric characterizations of the Cr-doped ZnZrTa2O8 ceramics were investigated by dielectric spectroscopy technique depending on changing frequency and temperature. The results highlight that the dielectric behaviors of the ZnZrTa2O8 ceramics are function of the Cr-doping.