Deposition and characterization of ZnSe nanocrystalline thin films

TEMEL S., GÖKMEN F. Ö., YAMAN E., Nebi M.

Turkish Physical Society 33rd International Physics Congress, TPS 2017, Konacik-Bodrum, Türkiye, 6 - 10 Eylül 2017, cilt.1935 identifier

  • Yayın Türü: Bildiri / Tam Metin Bildiri
  • Cilt numarası: 1935
  • Doi Numarası: 10.1063/1.5026008
  • Basıldığı Şehir: Konacik-Bodrum
  • Basıldığı Ülke: Türkiye
  • Bilecik Şeyh Edebali Üniversitesi Adresli: Evet

Özet

© 2018 Author(s).ZnSe nanocrystalline thin films were deposited at different deposition times by using the Chemical Bath Deposition (CBD) technique. Effects of deposition time on structural, morphological and optical properties of the obtained thin films were characterized. X-ray diffraction (XRD) analysis was used to study the structural properties of ZnSe nanocrystalline thin films. It was found that ZnSe thin films have a cubic structure with a preferentially orientation of (111). The calculated average grain size value was about 28-30 nm. The surface morphology of these films was studied by the Field Emission Scanning Electron Microscope (FESEM). The surfaces of the thin films were occurred from small stacks and nano-sized particles. The band gap values of the ZnSe nanocrystalline thin films were determined by UV-Visible absorption spectrum and the band gap values were found to be between 2.65-2.86 eV.