The effect of reaction rate on CdTe films produced by electrodeposition method
PHYSICA SCRIPTA, cilt.101, sa.385906, ss.1-16, 2026 (SCI-Expanded, Scopus)
- Yayın Türü: Makale / Tam Makale
- Cilt numarası: 101 Sayı: 385906
- Basım Tarihi: 2026
- Doi Numarası: 10.1088/1402-4896/aea71d
- Dergi Adı: PHYSICA SCRIPTA
- Derginin Tarandığı İndeksler: Scopus, Science Citation Index Expanded (SCI-EXPANDED), Chemical Abstracts Core, Compendex, INSPEC, zbMATH
- Sayfa Sayıları: ss.1-16
- Bilecik Şeyh Edebali Üniversitesi Adresli: Evet
Özet
In this work, CdTe thin films were electrodeposited on ITO-coated glass substrates. CdCl2 and Na2TeO3 served as cadmium and tellurium sources, respectively. Na2SO3 concentration was varied to investigate reaction-rate effects on the film properties. To the best of our knowledge, reaction-rate control using Na2SO3 has not been investigated in electrodeposited CdTe films. Cyclic voltammetry measurements showed that increasing the Na2SO3 concentration progressively suppressed the cathodic current density in the potential region relevant to CdTe deposition, particularly around the selected deposition potential of −0.6 V, confirming a reduction in the overall electrodeposition kinetics. x-ray diffractometer analysis confirmed the cubic CdTe phase in all samples, while the crystallite size decreased from 40 to 14 nm and the dislocation density increased from 6.25 × 1014 to 51.0 × 1014 line m−2. UV–Vis analysis showed that absorbance values decreased with increasing Na2SO3 concentration, and the optical band gap increased from 1.17 eV to 1.49 eV. SEM images revealed that low Na2SO3 concentrations improved the surface homogeneity of the CdTe films, whereas higher Na2SO3 concentrations reduced the surface coverage due to the slower deposition kinetics. Cross-sectional SEM analysis showed that the film thickness decreased from 1143 nm to 487 nm with increasing Na2SO3 concentration. Surface roughness analysis showed that the root mean square roughness (Rq) decreased from 19.58 nm to 8.75 nm, while the arithmetic mean roughness (Ra) decreased from 16.19 nm to 6.41 nm. Four-point probe measurements showed that the surface resistivity decreased from 51.453 to 1.467 kΩ·cm with increasing Na2SO3 content. energy-dispersive x-ray analysis revealed an increase in the Cd/Te atomic ratio from 0.951 to 1.481, indicating an apparent shift from slightly Te-rich toward Cd-rich compositions. These results suggest that Na2SO3 can be used to modify the structural, morphological, optical, compositional, and electrical properties of CdTe films by altering the reaction rate during electrodeposition.