Short-termflickerseverity indexcalculation using Hilbert-Huang Transform Kisa dönem kirpişma şi̇ddeti̇ni̇n Hilbert-Huang dönüşümü i̇le hesaplanmasi

ÖNAL Y., Gerek Ö. N., Ece D. G.

2011 IEEE 19th Signal Processing and Communications Applications Conference, SIU 2011, Antalya, Türkiye, 20 - 22 Nisan 2011, ss.230-233, (Tam Metin Bildiri) identifier

  • Yayın Türü: Bildiri / Tam Metin Bildiri
  • Doi Numarası: 10.1109/siu.2011.5929630
  • Basıldığı Şehir: Antalya
  • Basıldığı Ülke: Türkiye
  • Sayfa Sayıları: ss.230-233
  • Bilecik Şeyh Edebali Üniversitesi Adresli: Evet

Özet

This article proposes an approach to calculate the short term flicker magnitude (Pst) using Hilbert-Huang Transform (HHT). HHT is an approach which is commonly used in the analysis of nonlinear and nonstationary signals. Since flicker corresponds to a variation of the envelope of a sinusoidal voltage waveform, the utilization of HHT is reasonable. The magnitude of the short term flicker (Pst) is an important power quality parameter that is established by the International Electrotechnical Commission (IEC). In the proposed method, the HHT parameters such as Empirical Mode Decomposition (EMD) and Intrinsic Mode Function (IMF) are evaluated. The short term flicker magnitude (Pst) is claimed to be determined as a nonlinear and statistical function of the waveform magnitude and frequencies obtained by EMD, which is known to succeed in determination of envelope variations. The proposed method is also experimentally observed to precisely determine the (Pst) value. © 2011 IEEE.