Characterization Antimony and Fluorine Doped Tin Oxide Thin Films With XRD SEM and FTIR Dependent On Substrate Temperatures

BATTAL A., TATAR D., KOÇYİĞİT A., SÖNMEZ E.

International Semiconductor Science and Technology Conference, 13 - 15 January 2014, (Summary Text)

• Publication Type: Conference Paper / Summary Text
• Bilecik Şeyh Edebali University Affiliated: No