The thickness effect of insulator layer between the semiconductor and metal contact on C-V characteristics of Al/Si3N4/p-Si device
PAMUKKALE UNIVERSITY JOURNAL OF ENGINEERING SCIENCES-PAMUKKALE UNIVERSITESI MUHENDISLIK BILIMLERI DERGISI, vol.23, no.5, pp.536-542, 2017 (TRDizin)
- Publication Type: Article / Article
- Volume: 23 Issue: 5
- Publication Date: 2017
- Doi Number: 10.5505/pajes.2016.23911
- Journal Name: PAMUKKALE UNIVERSITY JOURNAL OF ENGINEERING SCIENCES-PAMUKKALE UNIVERSITESI MUHENDISLIK BILIMLERI DERGISI
- Journal Indexes: TR DİZİN (ULAKBİM)
- Page Numbers: pp.536-542
- Bilecik Şeyh Edebali University Affiliated: No